Brewer Science

  • Careers
  • MSDS
  • Environment
  • Site Map
  • 2: Markets
    • 2.1: Semiconductor
    • 2.3: MEMS, Sensors & Displays
      • 2.3.1: Micromachining
      • 2.3.2: Surface Energy Modification
      • 2.3.3: Leveling Extreme Topography
      • 2.3.4: Thin Wafer Handling
      • 2.3.5: MEMS FAQs
    • 2.4: Advanced Packaging
      • 2.4.1: Thin Wafer Handling
        • 2.4.1.1: ZoneBOND™ Process
        • 2.4.1.2: Chemical Debonding
        • 2.4.1.3: Thermal Slide Debonding
      • 2.4.2: Planarization - Trench Fill
      • 2.4.3: Surface Protection
      • 2.4.5: Micromachining
      • 2.4.6: Advanced Packaging FAQs
    • 2.5: LED & Energy
      • 2.5.1: Light Extraction
      • 2.5.2: Wet Etch Protection
      • 2.5.3: Physical Protection
      • 2.5.4: Metal Deposition & Alternatives
      • 2.5.5: Thin Wafer Handling
      • 2.5.6: LED FAQs
    • 2.6: Semiconductor Equipment
  • 4: Products
    • 4.1: Anti-Reflective Coatings
      • 4.1.1: Dry Etch ARC® Coatings
        • 4.1.1.1: 193-nm (ArF) Products
        • 4.1.1.2: 248-nm (KrF) Products
        • 4.1.1.3: 365-nm (i-Line) Products
          • 4.1.1.3.1: ARC i-CON Coating
          • 4.1.1.3.2: XHRiC Coating
          • 4.1.1.3.3: WiDE®-C Coating
          • 4.1.1.3.4: GenARC® 365 Coating
      • 4.1.2: Developer-Soluble BARC
      • 4.1.3: Ancilliary Products
      • 4.1.7: PFOS-Free Program
      • 4.1.8: FAQs
    • 4.2: OptiStack® Systems
      • 4.2.1: OptiStack® Simulation
    • 4.3: Lift-Off Materials
    • 4.4: EUV Assist Layers
    • 4.5: Gap-Fill Systems
    • 4.6: Protective Coatings
      • 4.6.1: Lift-Off Materials
      • 4.6.2: ProTEK® SR Coating
      • 4.6.3: ProTEK® B3 Coatings
      • 4.6.4: ProTEK® PSB Coating
      • 4.6.5: EdgeWRAP® System
      • 4.6.6: FAQs
    • 4.9: Temporary Bonding
      • 4.9.1: ZoneBOND™ Process
      • 4.9.2: WaferBOND® CR-200
      • 4.9.3: WaferBOND® HT-10.10
    • 4.10: Processing Equipment
      • 4.10.1: Spin Coaters
        • 4.10.1.1: Spin Coater (200X)
        • 4.10.1.3: Heavy-Duty-Drive Spin Coater (300X)
      • 4.10.2: Bake Plates
        • 4.10.2.1: Bake Plate (1300X)
        • 4.10.2.2: 300-mm Bake Plate (10)
        • 4.10.2.3: 450-mm Bake Plate (11)
      • 4.10.3: Developers
        • 4.10.3.1: Developer (200XD)
        • 4.10.3.2: Developer (300XD)
        • 4.10.3.3: Megasonic Developer / Cleaner (300MXD)
      • 4.10.4: Combination Tools
        • 4.10.4.1: Develop-Bake System (200DBX)
        • 4.10.4.2: Coat-Bake System (200CBX)
      • 4.10.5: Flange Mount Systems
      • 4.10.6: Wafer Debonders
        • 4.10.6.1: Slide Debonder (1300DB)
        • 4.10.6.2: ZoneBOND™ Separation Tool
        • 4.10.6.3: Slide Debonder (1300CSX)
      • 4.10.7: EdgeWRAP® System
      • 4.10.10: Automated Bottle Filling System
      • 4.10.11: Processing Theory
      • 4.10.14: Equipment FAQs
      • 4.10.16: Testimonials
    • 4.11: Carbon Nanotube Solutions
    • 4.12: High-Refractive Index
    • 4.15: Planarization Solutions
    • 4.16: Etch Protection Solutions
    • 4.17: Alignment Coatings
    • 4.18: FAQs
      • 4.18.1: Advanced Packaging FAQs
      • 4.18.2: Lithography FAQs
      • 4.18.3: MEMS FAQs
      • 4.18.4: Equipment FAQs
      • 4.18.5: LED FAQs
  • 6: Research
    • 6.1: Publications
    • 6.2: Patents
    • 6.3: Processing Theory
      • 6.3.1: Bake Plate Overview
      • 6.3.2: Bake Plate Process Theory
      • 6.3.3: Spin Coater Theory
      • 6.3.4: Processing Equipment
  • 8: Company
    • 8.3: Vision
    • 8.7: Global Operations
      • 8.7.1: North America
      • 8.7.2: Asia
      • 8.7.3: Europe
    • 8.8: Quality
      • 8.8.1: Customer Satisfaction
      • 8.8.2: Customer Quality Report Portal
      • 8.8.3: Registrations
    • 8.11: Testimonials
    • 8.13: Media
  • 9: Contact Us
    • 9.4: Global Operations
  • 27: Blog
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News

IMAPS Microelectronics Symposium

Oct. 31"“Nov. 4, 2010 Research Triangle, NC

Brewer Science Papers

  • Filling and Planarizing Deep Trenches with Polymer for Through-Silicon Via Technology
  • Advanced Thin Wafer Support Processes for Temporary Wafer Bonding

Conference Details



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