To form trench patterns in the Metal 1 dielectric layer an ARCŪ layer and photoresist are applied to create an etch mask.
The ARCŪ layer provides the needed reflectivity control to form the pattern of the lines and spaces required at this critical layer.
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1.The ARCŪ layer and photoresist are applied to the Metal 1 substrate.
2. The photoresist is exposed and developed. The resulting photoresist feature is then transferred into the ARCŪ layer by reactive ion etching (RIE) to form the Metal 1 etch mask.
3. The Metal 1 is RIE etched down to the BPSG layer and the W plugs to make contact with the gates and source/drain.
4. The photoresist and ARCŪ layers are removed and the substrate is ready for the liner and seed deposition. The liner is typically TaN and Ta. This is followed by the deposition of a thin Cu seed layer. |
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Depending on your wavelength and photoresist compatibility, here are the suggested BARC products:
193nm ARCŪ Products |
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