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The XHRiC series of anti-reflective coatings has been specifically designed for advanced i-line dry patterning processes. The materials are highly absorbent with n-values of 1.81 and k-values of 0.34, providing excellent CD control by eliminating standing waves and reflective notching. These highly robust products have been successfully utilized in a wide range of processes at poly, gate and metalization levels for 0.25µm design rules.
Features: - Proven compatibility with nearly all i-line resists
- Demonstrated with the newest generation of resists
- Planar, thermal crosslinking BARC
- Spin bowl, drain compatible with EBR processes
- Optical properties are optimized for i-line performance
- Ultra low particle counts
- Low metal ions.
Need more information about this product? Please click here to access our request form or call +573.364.0300 (U.S.A.) and request an ARC® products technical expert.
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