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December 06, 2018 Press Release
Imec reports for the first time direct growth of 2D materials on 300mm wafers

Release Originally Posted on IMEC's website here: https://www.imec-int.com/en/articles/imec-reports-for-the-first-time-direct-growth-of-2d-materials-on-300mm-wafers SAN FRANCISCO (USA), DECEMBER 3, 2018 — This week, at the 2018 IEEE International Electron Devices Meeting (IEDM), imec, the world-leading research…

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November 15, 2018 Blogs
Diversity Breeds Innovation, and We’ll Showcase Both at IMAPS

  Since our inception, Brewer Science has been strongly committed to cultivating diversity. And we do so for one primary reason: a broad range of backgrounds leads to better ideas…

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October 15, 2018 Blogs
Thin-wafer handling: Spin chuck designs for thinned substrates

Thin-wafer processing trends Several spin-coating process applications require the ability to uniformly coat, develop, and/or rinse (clean) thinned and fragile substrates. Safely handling these fragile materials is paramount and requires…

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October 15, 2018 Blogs
Developer options for spin-on photosensitive materials

Developing photosensitive film layers to produce features of targeted sizes is a critical process step within any photolithography application. Application engineers have created several processes for performing this step with…

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October 15, 2018 Blogs
Thermal slide debonding for temporary bonding processes (Part 1 of 3)

The microelectronics industry is rapidly migrating to fabricating 3-D wafer stacking interconnects using through-silicon via (TSV) technology. Major market segments seeking to benefit from TSV technology include advanced packaging for…

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October 15, 2018 Blogs
Thermal slide debonding for temporary bonding processes (Part 2 of 3)

In addition to precisely controlling application of the materials that enable wafer bonding, a solvent-enriched sealed spin chamber contributes to process integrity. One of the most critical variables in achieving…

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October 15, 2018 Blogs
Thermal slide debonding for temporary bonding processes (Part 3 of 3)

Thermal slide debonding represents the next significant advancement in obtaining high-yield thin wafer results. Initial detection of anomalies and cracks usually occurs during debonding; however, many causes for this damage…

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